VANADIUM OXIDES: METHOD 7504, Issue 2, dated 15 August 1994 - Page 6 of 10 For the analytes, biases of spiked samples were determined by assuming the volume of suspension as "true." Biases of generated samples were determined by assuming that the concentration obtained from the ICP-AES analysis of monitor AAWP filters was the "true" concentration. Instrumental imprecision increases with smaller depositions. For low loading levels, higher counting times will increase precision, as should sample spinning. The stated lower limit of quantitation of ca. 100 µg per analyte when the recommended analytical lines were used is an estimate based on numerous spiked and generated sample experiments.
REFERENCES:
[1] [2] [3] [4] [5]
[6] [7]
T. Carsey, "Quantitation of Vanadium Oxides in Airborne Dusts by X-Ray Diffraction," Anal. Chem., 57: 2125-2130 (1985). NIOSH Manual of Analytical Methods, 2nd ed., Vol. 8 (unpublished, 1982). Powder Diffraction File Search Manual, International Centre for Diffraction Data (JCPDS), Swarthmore, PA, 19081, p. 809 (1981). Ibid., p. 810. M. Abell, D. Dollberg, J. Crable, "Quantitative Analysis of Dust Samples from Occupational Environments Using Computer-Automated X-ray Diffraction," in Advances in X-Ray Analysis , Vol. 24, Plenum, p. 37 (1981). E. Bertin: Principles and Practice of X-ray Spectrometric Analysis , 2 nd Ed., Plenum, New York, p. 471 (1975). Criteria for a Recommended Standard...Occupational Exposure to Vanadium, U.S. Department of Health, Education, and Welfare, Publ. (NIOSH) 77-222 (1977).
METHOD REVISED BY: Charles Lorberau, NIOSH/DPSE.
NIOSH Manual of Analytical Methods (NMAM), Fourth Edition, 8/15/94
